The vulnerability of PERC modules to LID and LeTID is well known and among the reasons the industry is moving towards N-type technology, which tends to be less affected by the two phenomena. TUV Nord ...

“Four years ago, that was at 50% and it’s steadily increased since,” said Tristan Erion-Lorico. Image: Kiwa PVEL. A total of 83% of module manufacturers have had at least one test failure in the Kiwa ...