In recent decades, the preparation of samples for transmission electron microscopes has transformed, thanks to the introduction of focused ion beam (FIB) instruments. Known as either single-beam or ...

Observations at the nanoscale can provide profound insights into materials science. Yet, the characterization of beam-sensitive and reactive materials has proven challenging. In order to address this ...

Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...

The Hitachi FB-2000A FIB uses a beam of focused high-energy (30 kV) gallium ions to remove material in a very controlled manner from inorganic specimens. The FB-2000A is a single beam system; that is, ...

TEM lamella preparation is essential for almost any FIB-SEM user. Go beyond conventional TEM sample preparation with the ZEISS Crossbeam FIB-SEM. Users can maximize their productivity for TEM lamella ...

CASI houses the Thermo Scientific Helios 5 UX DualBeam Focus Ion Beam/Scanning Electron Microscope (FIB-SEM) to accelerate nanotechnology research and development at the University of Wyoming. This ...

New ZEISS Gemini 4 electron optics offer superior resolution and signal-to-noise ratio Live SEM imaging extended to monitor rapid FIB milling down to ultrafine lamella polishing Largest undistorted ...

Advances in simultaneous SEM imaging while FIB milling provide unmatched feedback for precision endpointing New ZEISS Gemini 4 electron optics offer superior resolution and signal-to-noise ratio Live ...

In transmission electron microscopy (TEM), where the electron beam passes through the sample to be directly imaged on the detector below, it is often necessary to support the thin samples on a grid.

ZEISS Crossbeam 750 FIB-SEM advances live, high-resolution "see while you mill” capability, providing unmatched feedback for precision endpointing in sample preparation workflows. New ZEISS Gemini 4 ...