For more than four decades, scan technology has somehow eluded the radar screen of the IC test industry. As test continues to evolve and make significant newsworthy changes, scan has maintained a ...

Today's leading-edge system-on-chip (SoC) designs typically have multiple clock domains and, in many cases, multiple internally generated clocks. In test mode, those clocks may be combined into one, ...

Why isolated flows negatively impact design schedule and PPA. Benefits of unified DFT, synthesis, and physical design flows. Physical implementation optimization methods for test compression and scan ...