Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

Google Director of Research and renowned artificial intelligence (AI) expert Peter Norvig, presented an entirely different side of AI and machine learning at the EmTech Digital conference. He compared ...

[Robert Morrison] had an ancient HP 545A logic probe, which was great for debugging SMT projects. The only problem was that being 45 years old, it wasn’t quite up to scratch when it came to debugging ...