The semiconductor industry is driven by market demands forsmaller form factors, greater functionality, higher performance,lower power, component availability, and the need to integrate evermore ...

Writing correct concurrent programs is harder than writing sequential ones. This is because the set of potential risks and failure modes is larger - anything that can go wrong in a sequential program ...

Since the first transistors went into production almost six decades ago, semiconductor manufacturers have looked for ways to reduce test time and manufacturing costs. As the industry has grown from ...

Semiconductor manufacturers continue to look for ways to reduce the cost of test for producing mixed-signal SOC and SIP devices. Parallel test strategies, known as multisite test, implemented on ATE ...

It is with regret that we announce that Dr. Grant Boctor, president of Digitaltest, passed away in late March. He died of a sudden heart attack while traveling in Egypt. Dr. Boctor founded Digitaltest ...

Modern multithreaded, asynchronous code can be hard to debug. The complexity that comes with message passing and thread management results in bugs that can seem non-determinant, with little or no way ...

Dave Armstrong, director of business development at Advantest, discusses the usefulness of concurrent test and describes how to maximize the value of this approach.

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Derek Wu, senior staff applications engineer at Advantest, looks at the need for doing multiple tests at the same time as chip designs become more complex, increasingly heterogeneous, and much more ...